Multiprobe AFM Electrical Characterization and Tip Enhanced Raman Spectroscopy of Graphene on Silicon/Silicon Oxide Substrates
A multiprobe SPM system has been used to perform multiprobe thermal mapping correlated with AFM structure of carbon nanotubes suspended across nickel pads. In this system two probes have been used where one probe provides localized heating while a second probe is used to map topography and temperature distribution. Nanoheating is affected with a dual wire thermo-resistance probe with two platinum wires embedded in glass and fused at the tip of the probe which is fully exposed and protrudes well beyond the cantilever. The nano temperature mapping is achieved with a thermocouple probe consisting of a single platinum nanowire embedded in glass which is subsequently coated with a second metal to form a thermocouple junction. As in the nanoheater the tip of such a probe extends well beyond the cantilever readily allowing for mutiprobe measurements. The time response of this thermocouple is orders of magnitude higher than any other thermocouple in existence. Thus, one gains the ability to perform both static and dynamic thermal measurements in very localized regions with high precision. The results show the effectiveness of suspended carbon nanotubes to conduct heat.